Fundamental Flaw in Transistor Noise Theory Limits Low-Power Chip Development
Chip manufacturers beware: There’s a newfound flaw in our understanding of transistor noise, a phenomenon affecting the electronic on-off switch that makes computer circuits possible. According to the engineers at the National Institute of Standards and Technology (NIST) who discovered the problem, it will soon stand in the way of creating more efficient, lower-powered devices like cell phones and pacemakers unless we solve it.
While exploring transistor behavior, the team found evidence that a widely accepted model explaining errors caused by electronic “noise” in the switches does not fit the facts. A transistor must be made from highly purified materials to function; defects in these materials, like rocks in a stream, can divert the flow of electricity and cause the device to malfunction. This, in turn, makes it appear to fluctuate erratically between “on” and “off” states. For decades, the engineering community has largely accepted a theoretical model that identifies these defects and helps guide designers’ efforts to mitigate them. (more…)
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